Statements (27)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:microprocessor
transistor |
| gptkbp:category |
gptkb:microprocessor
|
| gptkbp:dataRetention |
years
|
| gptkbp:erasedBy |
Fowler-Nordheim tunneling
|
| gptkbp:hasComponent |
source
substrate drain oxide layer control gate floating gate |
| https://www.w3.org/2000/01/rdf-schema#label |
floating-gate MOSFET
|
| gptkbp:introducedIn |
1967
|
| gptkbp:inventedBy |
gptkb:Simon_Min_Sze
gptkb:Dawon_Kahng |
| gptkbp:operates |
charge storage
|
| gptkbp:programmingLanguage |
hot-carrier injection
|
| gptkbp:readBy |
measuring threshold voltage
|
| gptkbp:relatedTo |
gptkb:battery
SONOS memory charge trap flash |
| gptkbp:storesDataBy |
trapped electrons
|
| gptkbp:technology |
gptkb:CMOS
|
| gptkbp:usedIn |
gptkb:SDRAM
gptkb:EEPROM |
| gptkbp:bfsParent |
gptkb:Dawon_Kahng
|
| gptkbp:bfsLayer |
7
|