Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:foundedYear |
1976
|
| gptkbp:headquartersLocation |
gptkb:Milpitas,_California,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
Tencor Instruments (1997)
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:keyPerson |
gptkb:Kenneth_L._Schroeder
|
| gptkbp:mergedInto |
gptkb:KLA_Instruments
|
| gptkbp:notableProduct |
metrology equipment
surface inspection systems |
| gptkbp:status |
merged
|
| gptkbp:successor |
gptkb:KLA-Tencor
|
| gptkbp:bfsParent |
gptkb:KLA_Corporation
|
| gptkbp:bfsLayer |
6
|