Statements (12)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:headquartersLocation |
gptkb:Milpitas,_California,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA Instruments
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:parentCompany |
gptkb:KLA_Corporation
|
| gptkbp:products |
inspection systems
metrology equipment surface analysis tools |
| gptkbp:servesIndustry |
semiconductor manufacturing
|
| gptkbp:website |
https://www.kla.com/products/instruments/
|
| gptkbp:bfsParent |
gptkb:Tencor_Instruments_(1997)
|
| gptkbp:bfsLayer |
7
|