Scanning Near-field Optical Microscopy
GPTKB entity
Statements (33)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Microscopy technique
|
| gptkbp:abbreviation |
gptkb:SNOM
|
| gptkbp:alsoKnownAs |
gptkb:Near-field_Scanning_Optical_Microscopy
|
| gptkbp:application |
Material science
Biological imaging Semiconductor inspection |
| gptkbp:developedBy |
1980s
|
| gptkbp:enables |
Imaging beyond diffraction limit
Nanoscale optical imaging Nanoscale spectroscopy |
| gptkbp:field |
gptkb:Optics
Microscopy Nanotechnology |
| https://www.w3.org/2000/01/rdf-schema#label |
Scanning Near-field Optical Microscopy
|
| gptkbp:imagingMode |
gptkb:library
gptkb:Transmission Reflection |
| gptkbp:inventedBy |
gptkb:Aaron_Lewis
gptkb:Eric_Betzig gptkb:Aharon_Gedanken |
| gptkbp:limitation |
Slow scanning speed
Probe wear Sample damage |
| gptkbp:relatedTo |
gptkb:Atomic_Force_Microscopy
gptkb:Scanning_Tunneling_Microscopy |
| gptkbp:requires |
Piezoelectric scanner
Laser source Optical detector |
| gptkbp:resolution |
Sub-wavelength
|
| gptkbp:uses |
Sharp probe
Near-field effects |
| gptkbp:bfsParent |
gptkb:Near-field_Scanning_Optical_Microscopy
|
| gptkbp:bfsLayer |
6
|