Scanning Electron Microscopy (SEM)

URI: https://gptkb.org/entity/Scanning_Electron_Microscopy_%28SEM%29
GPTKB entity
Properties (52)
Predicate Object
gptkbp:instanceOf gptkb:Research_Institute
gptkbp:can_be conductive samples
magnifications up to 1,000,000x
non-conductive samples with coating
gptkbp:evaluates surface roughness
particle size
defects in materials
gptkbp:has_a gptkb:Transmission_Electron_Microscopy_(TEM)
gptkbp:hasDepartment sample conductivity
sample size
surface damage
vacuum requirements
gptkbp:hasPrograms quality control
forensic science
failure analysis
https://www.w3.org/2000/01/rdf-schema#label Scanning Electron Microscopy (SEM)
gptkbp:is_a_time_for imaging surfaces
gptkbp:is_a_tool_for materials characterization
nanotechnology research
failure analysis of electronic components
investigating corrosion processes
studying biological structures at the nanoscale
surface analysis of coatings
gptkbp:is_featured_in composite materials
ceramics
biological specimens
polymers
metallurgical samples
gptkbp:is_studied_in nanostructures
microstructures
gptkbp:is_used_in gptkb:Energy_Dispersive_X-ray_Spectroscopy_(EDX)
gptkb:Focused_Ion_Beam_(FIB)_systems
materials science
biological research
nanotechnology
pharmaceutical research
surface engineering
textile analysis
coating analysis
semiconductor inspection
gptkbp:mayHave surface topography
composition of materials
gptkbp:produces 1930s
high-resolution images
gptkbp:provides elemental analysis
three-dimensional images
morphological information
gptkbp:requires sample preparation
gptkbp:technique nan
gptkbp:uses secondary electrons
electron beams
backscattered electrons