Transmission Electron Microscopy (TEM)
GPTKB entity
Properties (60)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
electron microscopy
|
| gptkbp:appearsIn |
materials science
biological research nanotechnology |
| gptkbp:canBe |
defects in materials
|
| gptkbp:developedBy |
Ernst Ruska
|
| gptkbp:hasFacility |
0.1 nanometers
|
| https://www.w3.org/2000/01/rdf-schema#label |
Transmission Electron Microscopy (TEM)
|
| gptkbp:isIncorporatedIn |
1931
|
| gptkbp:isLocatedIn |
scanning transmission electron microscopy (STEM)
|
| gptkbp:isPartOf |
advanced microscopy techniques
|
| gptkbp:isStudiedIn |
electron scattering
|
| gptkbp:isUsedBy |
gptkb:quantum_dots
composites phase transitions viruses superconductors semiconductors thin films biomaterials cellular structures catalysts polymers nanoparticles magnetic materials dielectric materials surface phenomena nanostructures two-dimensional materials layered materials nanostructured materials metal oxides self-assembled structures biological macromolecules ferroelectric materials interfaces in materials thin film coatings surface coatings organic-inorganic hybrids |
| gptkbp:isUsedFor |
electron diffraction
internal structures energy-dispersive X-ray spectroscopy |
| gptkbp:isUsedIn |
metallurgy
semiconductor research pharmaceutical research nanomaterials characterization forensic_analysis |
| gptkbp:isUtilizedFor |
sample damage from electron beam
|
| gptkbp:isVisitedBy |
sample thickness
|
| gptkbp:mayHave |
crystal structures
thin specimens |
| gptkbp:operatesIn |
principle of wave-particle duality
|
| gptkbp:produces |
2D images
|
| gptkbp:provides |
atomic resolution
|
| gptkbp:relatedTo |
scanning electron microscopy
|
| gptkbp:requires |
sample preparation
high vacuum |
| gptkbp:usedFor |
high-resolution imaging
|
| gptkbp:uses |
electron beams
electromagnetic lenses |