Focused Ion Beam (FIB) systems
GPTKB entity
Statements (63)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Ion beam technology
|
| gptkbp:allows |
3D imaging
|
| gptkbp:canCreate |
Nanostructures
|
| gptkbp:developedBy |
Research institutions
|
| gptkbp:firstIntroduced |
1970s
|
| gptkbp:hasCapital |
Ion implantation
|
| gptkbp:hasEvents |
High spatial resolution
|
| https://www.w3.org/2000/01/rdf-schema#label |
Focused Ion Beam (FIB) systems
|
| gptkbp:is_studied_in |
Microstructures
|
| gptkbp:is_used_in |
Semiconductor industry
|
| gptkbp:isAvenueFor |
Biotechnology
Metrology |
| gptkbp:isBeneficialFor |
Nanotechnology
|
| gptkbp:isCelebratedFor |
X-ray microscopy
|
| gptkbp:isCompatibleWith |
Various materials
|
| gptkbp:isCriticizedFor |
Failure analysis
Device optimization |
| gptkbp:isEnhancedBy |
Software algorithms
Advanced optics |
| gptkbp:isEvaluatedBy |
Performance metrics
|
| gptkbp:isFacilitatedBy |
Computer software
|
| gptkbp:isImportantFor |
Quality control
|
| gptkbp:isIncorporatedIn |
Integrated circuits
Research equipment |
| gptkbp:isIntegratedWith |
Automated systems
|
| gptkbp:isInvolvedIn |
Device fabrication
Research applications |
| gptkbp:isOrganizedBy |
Trained personnel
|
| gptkbp:isPartOf |
Research laboratories
Advanced manufacturing processes Nanofabrication tools Microfabrication processes |
| gptkbp:isSubjectTo |
Regulatory standards
Ion beam damage |
| gptkbp:isUsedBy |
Modify surfaces
|
| gptkbp:isUsedFor |
gptkb:Scanning_Electron_Microscopy_(SEM)
Material properties Sample analysis Defect repair Device structures |
| gptkbp:isUsedIn |
Research and development
Academic research Electronics manufacturing Material characterization |
| gptkbp:isUtilizedFor |
Microelectronic devices
Material behavior Thin film analysis Prototype_development |
| gptkbp:isUtilizedIn |
Material science
Surface engineering |
| gptkbp:isVisitedBy |
Material type
High precision tasks |
| gptkbp:keyIssues |
Failure analysis
Nanostructure fabrication |
| gptkbp:mayHave |
Deposition
Milling |
| gptkbp:operatesIn |
Solid materials
|
| gptkbp:requires |
Vacuum environment
|
| gptkbp:usedFor |
Sample preparation
Material analysis Nanofabrication Circuit editing |
| gptkbp:utilizes |
Ion beams
|