Reflection high-energy electron diffraction
GPTKB entity
Statements (26)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Surface science technique
|
| gptkbp:abbreviation |
gptkb:RHEED
|
| gptkbp:analyzes |
electron diffraction patterns
|
| gptkbp:category |
gptkb:Electron_diffraction
Surface analysis methods |
| gptkbp:detects |
surface reconstruction
surface crystallography surface morphology |
| gptkbp:geometry |
grazing incidence
|
| https://www.w3.org/2000/01/rdf-schema#label |
Reflection high-energy electron diffraction
|
| gptkbp:inventedBy |
1930s
|
| gptkbp:provides |
real-time feedback
atomic layer information |
| gptkbp:range |
10-100 keV
|
| gptkbp:relatedTo |
gptkb:Low-energy_electron_diffraction
gptkb:Molecular_beam_epitaxy |
| gptkbp:requires |
ultra-high vacuum
|
| gptkbp:usedBy |
semiconductor industry
materials scientists surface physicists |
| gptkbp:usedIn |
in-situ monitoring
surface structure analysis thin film growth monitoring |
| gptkbp:uses |
high-energy electrons
|
| gptkbp:bfsParent |
gptkb:Molecular_Beam_Epitaxy
|
| gptkbp:bfsLayer |
6
|