Properties (52)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:Company
|
| gptkbp:acquisition |
gptkb:KLA_Corporation
gptkb:Tencor_Instruments KLA Instruments |
| gptkbp:awards |
Best Places to Work
Innovation Awards Sustainability Awards |
| gptkbp:businessModel |
B2B
Technology solutions Service-oriented |
| gptkbp:CEO |
gptkb:Tsu-Jae_King_Liu
|
| gptkbp:communityInvolvement |
Charitable donations
STEM education initiatives Employee volunteer programs |
| gptkbp:competitors |
gptkb:Lam_Research
gptkb:ASML Applied Materials |
| gptkbp:employees |
Over 10,000
|
| gptkbp:financials |
Publicly traded company
Ticker symbol: KLAC Listed_on_NASDAQ |
| gptkbp:focus |
Process control
Metrology Defect inspection Yield_management |
| gptkbp:foundedIn |
1997
|
| gptkbp:globalPresence |
Worldwide
|
| gptkbp:headCoach |
10,000+
|
| gptkbp:headquarters |
gptkb:Milpitas,_California
KLA_Corporation_headquarters |
| gptkbp:history |
Founded_through_the_merger_of_KLA_Instruments_and_Tencor_Instruments.
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Services LLC
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:keyPeople |
gptkb:Richard_P._Wallace
|
| gptkbp:marketShare |
Leading market share in semiconductor inspection
Significant market share in metrology |
| gptkbp:parentCompany |
gptkb:KLA_Corporation
|
| gptkbp:partnerships |
Research institutions
Universities Various semiconductor manufacturers |
| gptkbp:patentCitation |
Numerous patents in semiconductor technology
|
| gptkbp:products |
Software solutions
Inspection systems Metrology systems |
| gptkbp:researchAndDevelopment |
Significant investment
|
| gptkbp:revenue |
$4 billion (2020)
|
| gptkbp:services |
Process control and yield management
|
| gptkbp:subsidiary |
gptkb:KLA_Corporation
|
| gptkbp:trademark |
gptkb:KLA
gptkb:Tencor gptkb:KLA-Tencor |
| gptkbp:website |
www.kla.com
|