JSM series scanning electron microscopes
GPTKB entity
Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electron_microscope
|
| gptkbp:application |
biological sciences
materials science forensics semiconductor inspection |
| gptkbp:feature |
high resolution imaging
energy-dispersive X-ray spectroscopy compatibility various magnification levels |
| https://www.w3.org/2000/01/rdf-schema#label |
JSM series scanning electron microscopes
|
| gptkbp:introduced |
gptkb:JEOL
|
| gptkbp:manufacturer |
gptkb:JEOL
|
| gptkbp:marketedAs |
1960s
|
| gptkbp:notableModel |
gptkb:JSM-7001F
gptkb:JSM-7800F gptkb:JSM-IT100 |
| gptkbp:technology |
electron beam
|
| gptkbp:usedFor |
material analysis
surface imaging microstructure characterization |
| gptkbp:bfsParent |
gptkb:JEOL
|
| gptkbp:bfsLayer |
7
|