Statements (20)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electron_microscope
|
| gptkbp:application |
gptkb:nanotechnology
life sciences materials science |
| gptkbp:countryOfOrigin |
gptkb:Japan
|
| gptkbp:detects |
backscattered electron detector
secondary electron detector energy dispersive X-ray spectrometer (EDS) |
| gptkbp:electron_source |
field emission gun
|
| gptkbp:feature |
analytical capabilities
high throughput imaging large specimen chamber low voltage imaging |
| https://www.w3.org/2000/01/rdf-schema#label |
JSM-7800F
|
| gptkbp:manufacturer |
gptkb:JEOL
|
| gptkbp:marketedAs |
2010s
|
| gptkbp:resolution |
1.0 nm at 15 kV
1.2 nm at 1 kV |
| gptkbp:bfsParent |
gptkb:JSM_series_scanning_electron_microscopes
|
| gptkbp:bfsLayer |
8
|