Highly Accelerated Stress Screening
GPTKB entity
Statements (14)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:reliability_testing_method
|
| gptkbp:abbreviation |
gptkb:HASS
|
| gptkbp:appliesStressType |
vibration
thermal cycling |
| gptkbp:goal |
improve product reliability
|
| gptkbp:numberOfStages |
production phase
|
| gptkbp:originatedIn |
gptkb:Highly_Accelerated_Life_Testing
|
| gptkbp:purpose |
detect latent defects
|
| gptkbp:relatedTo |
gptkb:Highly_Accelerated_Life_Testing
|
| gptkbp:usedIn |
electronics manufacturing
|
| gptkbp:bfsParent |
gptkb:Highly_Accelerated_Life_Testing
gptkb:Highly_Accelerated_Life_Test |
| gptkbp:bfsLayer |
8
|
| http://www.w3.org/2000/01/rdf-schema#label |
Highly Accelerated Stress Screening
|