Highly Accelerated Life Test
GPTKB entity
Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
reliability testing method
|
| gptkbp:abbreviation |
gptkb:HALT
|
| gptkbp:appliesTo |
systems
electronic components mechanical assemblies |
| gptkbp:developedBy |
gptkb:Gregg_K._Hobbs
|
| gptkbp:goal |
find failure modes
|
| https://www.w3.org/2000/01/rdf-schema#label |
Highly Accelerated Life Test
|
| gptkbp:introducedIn |
1980s
|
| gptkbp:involves |
thermal cycling
stress testing vibration testing rapid temperature changes |
| gptkbp:method |
step-stress approach
|
| gptkbp:purpose |
improve product reliability
identify product weaknesses |
| gptkbp:relatedTo |
gptkb:Highly_Accelerated_Stress_Screening
reliability engineering |
| gptkbp:result |
improved design robustness
|
| gptkbp:usedIn |
manufacturing
electronics industry |
| gptkbp:bfsParent |
gptkb:HALT
|
| gptkbp:bfsLayer |
7
|