Highly Accelerated Life Testing
GPTKB entity
Statements (28)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
testing methodology
|
| gptkbp:abbreviation |
gptkb:HALT
|
| gptkbp:appliesTo |
electronic components
mechanical systems assemblies |
| gptkbp:distinctFrom |
traditional life testing
|
| gptkbp:feature |
not intended for qualification
uses step-stress approach |
| gptkbp:goal |
find failure modes quickly
|
| https://www.w3.org/2000/01/rdf-schema#label |
Highly Accelerated Life Testing
|
| gptkbp:method |
subject product to extreme stress
|
| gptkbp:originatedIn |
1980s
|
| gptkbp:purpose |
improve product reliability
identify product weaknesses |
| gptkbp:relatedTo |
gptkb:Highly_Accelerated_Stress_Screening
reliability testing |
| gptkbp:result |
design improvements
increased product robustness |
| gptkbp:stressType |
humidity
vibration temperature cycling voltage |
| gptkbp:usedBy |
manufacturers
product designers quality engineers |
| gptkbp:usedIn |
reliability engineering
|
| gptkbp:bfsParent |
gptkb:Environmental_Stress_Screening
|
| gptkbp:bfsLayer |
7
|