Automotive Electronics Council Q100
GPTKB entity
Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:abbreviation |
gptkb:AEC-Q100
|
| gptkbp:appliesTo |
semiconductor devices
integrated circuits |
| gptkbp:documentType |
qualification standard
|
| gptkbp:firstPublished |
1994
|
| gptkbp:focusesOn |
reliability
stress testing failure mechanisms |
| https://www.w3.org/2000/01/rdf-schema#label |
Automotive Electronics Council Q100
|
| gptkbp:industry |
automotive
|
| gptkbp:publishedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:purpose |
qualification testing
|
| gptkbp:region |
global
|
| gptkbp:relatedStandard |
gptkb:AEC-Q101
gptkb:AEC-Q200 |
| gptkbp:usedBy |
automotive manufacturers
semiconductor suppliers |
| gptkbp:website |
https://www.aecouncil.com/
|
| gptkbp:bfsParent |
gptkb:AEC-Q100
|
| gptkbp:bfsLayer |
6
|