Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
integrated circuits
|
| gptkbp:contains |
stress test qualification for ICs
|
| gptkbp:firstPublished |
1994
|
| gptkbp:focusesOn |
reliability qualification
|
| gptkbp:fullName |
gptkb:Automotive_Electronics_Council_Q100
|
| https://www.w3.org/2000/01/rdf-schema#label |
AEC-Q100
|
| gptkbp:includes |
temperature cycling
early life failure rate tests electrostatic discharge tests high temperature operating life moisture resistance tests |
| gptkbp:industry |
automotive electronics
|
| gptkbp:publishedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:region |
global
|
| gptkbp:relatedStandard |
gptkb:AEC-Q101
gptkb:AEC-Q200 |
| gptkbp:updated |
multiple versions
|
| gptkbp:usedBy |
semiconductor manufacturers
automotive OEMs |
| gptkbp:website |
https://www.aecouncil.com/Automotive_Electronics_Council_Standards.html
|
| gptkbp:bfsParent |
gptkb:Automotive_Electronics_Council
|
| gptkbp:bfsLayer |
5
|