Statements (16)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:automotive_industry_standard
|
| gptkbp:appliesTo |
multi-chip modules
|
| gptkbp:defines |
stress test qualification for multi-chip modules
|
| gptkbp:firstPublished |
2016
|
| gptkbp:focusesOn |
qualification requirements
|
| gptkbp:latestReleaseVersion |
2022
Rev E |
| gptkbp:publishedBy |
gptkb:Automotive_Electronics_Council
|
| gptkbp:relatedTo |
gptkb:AEC-Q100
gptkb:AEC-Q101 gptkb:AEC-Q102 gptkb:AEC-Q200 |
| gptkbp:usedIn |
automotive electronics
|
| gptkbp:bfsParent |
gptkb:Automotive_Electronics_Council
|
| gptkbp:bfsLayer |
5
|
| http://www.w3.org/2000/01/rdf-schema#label |
AEC-Q104
|