Statements (29)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:scientific_instrument
|
| gptkbp:abbreviation |
EPMA
|
| gptkbp:alsoKnownAs |
electron probe microanalyzer
|
| gptkbp:analyzes |
solid samples
|
| gptkbp:can_resolve |
micrometer-scale features
|
| gptkbp:detects |
characteristic X-rays
|
| gptkbp:foundIn |
geology laboratories
materials science laboratories metallurgy laboratories |
| gptkbp:inventedBy |
1950s
Raymond Castaing |
| gptkbp:measures |
elemental composition
concentration of elements |
| gptkbp:relatedTo |
gptkb:electron_microscope
energy-dispersive X-ray spectroscopy wavelength-dispersive X-ray spectroscopy |
| gptkbp:requires |
vacuum environment
|
| gptkbp:usedFor |
chemical analysis
microanalysis elemental analysis |
| gptkbp:uses |
gptkb:electron_gun
electron optics focused electron beam sample stage X-ray spectrometers |
| gptkbp:bfsParent |
gptkb:microbeam_XRF
gptkb:Electron_Probe_Microanalysis_Laboratory |
| gptkbp:bfsLayer |
8
|
| https://www.w3.org/2000/01/rdf-schema#label |
electron microprobe
|