Titan Transmission Electron Microscope
GPTKB entity
Statements (16)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electron_microscope
|
| gptkbp:features |
electron energy loss spectroscopy
energy-dispersive X-ray spectroscopy aberration correction |
| gptkbp:launched |
2005
|
| gptkbp:location |
various research institutions worldwide
|
| gptkbp:manufacturer |
gptkb:FEI_Company
|
| gptkbp:notableFor |
atomic-scale imaging
|
| gptkbp:operatingSystem |
60-300 kV
|
| gptkbp:resolution |
sub-angstrom
|
| gptkbp:usedFor |
nanotechnology research
materials science research high-resolution imaging |
| gptkbp:bfsParent |
gptkb:FEI_Company
|
| gptkbp:bfsLayer |
7
|
| https://www.w3.org/2000/01/rdf-schema#label |
Titan Transmission Electron Microscope
|