Statements (12)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:research_institute
|
| gptkbp:affiliatedWith |
Department of Physics, IIT Delhi
|
| gptkbp:country |
gptkb:India
|
| gptkbp:focusesOn |
surface science
materials characterization |
| https://www.w3.org/2000/01/rdf-schema#label |
Surface Analysis Laboratory
|
| gptkbp:locatedIn |
gptkb:Indian_Institute_of_Technology_Delhi
|
| gptkbp:technique |
gptkb:Auger_electron_spectroscopy
gptkb:X-ray_photoelectron_spectroscopy secondary ion mass spectrometry |
| gptkbp:bfsParent |
gptkb:Department_of_Materials_Science_and_Metallurgy
|
| gptkbp:bfsLayer |
7
|