Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Radiation-induced error
|
| gptkbp:affects |
semiconductor devices
|
| gptkbp:alsoKnownAs |
gptkb:SEU
|
| gptkbp:causedBy |
radiation therapy
|
| gptkbp:compatibleWith |
permanent damage
|
| gptkbp:firstObserved |
1970s
|
| https://www.w3.org/2000/01/rdf-schema#label |
Single Event Upset
|
| gptkbp:mitigatedBy |
error correction
radiation hardening |
| gptkbp:occurredIn |
spacecraft electronics
terrestrial electronics |
| gptkbp:relatedTo |
gptkb:Single_Event_Latchup
gptkb:Single_Event_Transient Soft error |
| gptkbp:result |
bit flip
|
| gptkbp:studiedIn |
aerospace engineering
reliability engineering |
| gptkbp:bfsParent |
gptkb:SEU
|
| gptkbp:bfsLayer |
6
|