Statements (23)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
Electronics Failure Mode
Radiation Effect |
| gptkbp:affects |
Integrated Circuits
|
| gptkbp:canBe |
Heavy Ion Testing
Proton Testing |
| gptkbp:cause |
gptkb:Permanent_Damage
Device Destruction |
| gptkbp:causedBy |
Energetic Particle
Heavy Ion Strike |
| gptkbp:firstObserved |
Space Electronics
|
| https://www.w3.org/2000/01/rdf-schema#label |
Single Event Latchup
|
| gptkbp:mitigatedBy |
Guard Rings
Power Cycling Process Hardening |
| gptkbp:relatedTo |
gptkb:Single_Event_Upset
Radiation-Hardened Electronics Spacecraft Design Total Ionizing Dose |
| gptkbp:result |
High Current State
Parasitic Structure Activation |
| gptkbp:studiedBy |
Radiation Effects Engineers
|
| gptkbp:bfsParent |
gptkb:Single_Event_Upset
|
| gptkbp:bfsLayer |
7
|