Scanning Transmission Electron Microscopy (STEM)

URI: https://gptkb.org/entity/Scanning_Transmission_Electron_Microscopy_%28STEM%29
GPTKB entity
Properties (42)
Predicate Object
gptkbp:instanceOf gptkb:Research_Institute
gptkbp:can_be sub-angstrom resolution
gptkbp:developedBy scanning electron microscopy (SEM)
gptkbp:hasDepartment sample damage
cost of equipment
electron beam stability
expertise required for operation
https://www.w3.org/2000/01/rdf-schema#label Scanning Transmission Electron Microscopy (STEM)
gptkbp:is_a_time_for mapping elemental composition
characterizing materials
analyzing defects
imaging at the nanoscale
investigating nanostructures
studying interfaces
gptkbp:is_available_in biomaterials
nanoparticles
polymer structures
gptkbp:is_studied_in interfaces
thin films
nanostructures
heterostructures
gptkbp:is_used_in materials science
biological research
metallurgy
nanotechnology
semiconductor research
catalysis research
pharmaceutical research
electron_energy_loss_spectroscopy_(EELS)
energy-dispersive_X-ray_spectroscopy_(EDX)
gptkbp:mayHave atomic structure
crystal defects
composition of materials
gptkbp:provides high-resolution imaging
elemental mapping
phase contrast imaging
gptkbp:related_to gptkb:Transmission_Electron_Microscopy_(TEM)
gptkbp:requires sample preparation
high vacuum environment
gptkbp:sensors sample thickness
electron scattering
gptkbp:uses electron beams