SEMI International Standards
GPTKB entity
Statements (26)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:International_Standard
|
| gptkbp:developedBy |
SEMI (Semiconductor Equipment and Materials International)
|
| gptkbp:firstPublished |
1973
|
| gptkbp:focusesOn |
gptkb:microelectromechanical_systems_(MEMS)
semiconductor manufacturing flexible electronics photovoltaics flat panel display manufacturing |
| gptkbp:governingBody |
SEMI International Standards Program
|
| https://www.w3.org/2000/01/rdf-schema#label |
SEMI International Standards
|
| gptkbp:notableFor |
SEMI E30 (GEM)
SEMI E5 (SECS-I) SEMI F47 (Voltage Sag Immunity) SEMI M1 (Silicon Wafer Specification) SEMI S2 (Environmental, Health, and Safety) |
| gptkbp:purpose |
to ensure interoperability and quality in manufacturing
|
| gptkbp:reviewedBy |
industry volunteers
|
| gptkbp:standardNumber |
over 1000
|
| gptkbp:updated |
regularly
|
| gptkbp:usedIn |
equipment manufacturing
materials manufacturing device manufacturing global semiconductor industry |
| gptkbp:website |
https://www.semi.org/en/standards
|
| gptkbp:bfsParent |
gptkb:SEMI
|
| gptkbp:bfsLayer |
7
|