gptkbp:instance_of
|
gptkb:Company
|
gptkbp:acquired
|
gptkb:Nanometrics_Incorporated
|
gptkbp:acquisition
|
Merger
Acquired by Onto Innovation in 2020
|
gptkbp:acquisition_year
|
gptkb:2020
|
gptkbp:awards
|
Various industry awards
|
gptkbp:business_model
|
B2 B
|
gptkbp:ceo
|
gptkb:Paul_F._Mc_Laughlin
Paul Mc Laughlin
|
gptkbp:community_involvement
|
gptkb:Yes
|
gptkbp:competitors
|
gptkb:ASML_Holding
gptkb:Tokyo_Electron
gptkb:Corporation
gptkb:Applied_Materials
|
gptkbp:customer_base
|
Global semiconductor manufacturers
|
gptkbp:employees
|
Approximately 500
|
gptkbp:established_in
|
gptkb:1976
|
gptkbp:financials
|
gptkb:public_company
|
gptkbp:focus
|
Metrology
Yield Management Solutions
Advanced Packaging
Wafer Inspection
|
gptkbp:focus_area
|
Semiconductor Manufacturing
Inspection Systems
Process Control Equipment
Metrology Equipment
Yield Management Systems
|
gptkbp:founded
|
gptkb:1976
|
gptkbp:founder
|
gptkb:Rudolph_R._Rudolph
|
gptkbp:global_presence
|
gptkb:Yes
|
gptkbp:headcount
|
500+
|
gptkbp:headquarters
|
gptkb:Flanders,_NJ
gptkb:Flanders,_New_Jersey
|
https://www.w3.org/2000/01/rdf-schema#label
|
Rudolph Technologies, Inc.
|
gptkbp:industry
|
Semiconductor Equipment
|
gptkbp:innovation
|
Continuous innovation in technology
|
gptkbp:invention
|
Numerous patents in semiconductor technology
|
gptkbp:investment
|
Institutional and retail investors
|
gptkbp:location
|
gptkb:United_States
|
gptkbp:market
|
Global
|
gptkbp:market_cap
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Approximately $1 billion (2020)
|
gptkbp:partnership
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Various Semiconductor Manufacturers
|
gptkbp:product_line
|
Inspection and Metrology Equipment
|
gptkbp:products
|
Inspection Equipment
Metrology Equipment
|
gptkbp:research_and_development
|
gptkb:Yes
|
gptkbp:revenue
|
$150 million (2020)
|
gptkbp:service
|
Support and Maintenance Services
|
gptkbp:services
|
Process Control
Yield Management
|
gptkbp:stock_symbol
|
RTEC
|
gptkbp:subsidiary
|
gptkb:Rudolph_Technologies_(Asia)_Pte_Ltd.
|
gptkbp:sustainability_initiatives
|
gptkb:Yes
|
gptkbp:technology
|
gptkb:Software_Solutions
Metrology Systems
Optical Inspection
Laser Inspection
|
gptkbp:traded_on
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gptkb:NASDAQ
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gptkbp:type
|
gptkb:Public
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gptkbp:website
|
www.rudolphtech.com
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gptkbp:bfsParent
|
gptkb:Tokyo_Electron_Limited
|
gptkbp:bfsLayer
|
5
|