|
gptkbp:instance_of
|
gptkb:Company
|
|
gptkbp:acquisition
|
gptkb:Aetrium_Incorporated
gptkb:Opti_Pro_Systems
Accu-Glass
|
|
gptkbp:awards
|
Best Places to Work
Excellence in Manufacturing
Innovative Technology Award
|
|
gptkbp:ceo
|
gptkb:Dr._R._Scott_Mc_Murray
|
|
gptkbp:competitors
|
gptkb:Company
gptkb:ASML
gptkb:Tokyo_Electron
gptkb:Applied_Materials
|
|
gptkbp:employees
|
Approximately 300
|
|
gptkbp:founded
|
gptkb:1975
|
|
gptkbp:founder
|
gptkb:Dr._R._Scott_Mc_Murray
|
|
gptkbp:headcount
|
gptkb:300
|
|
gptkbp:headquarters
|
gptkb:Milpitas,_California
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
Nanometrics Incorporated
|
|
gptkbp:industry
|
Semiconductor
|
|
gptkbp:location
|
gptkb:United_States
|
|
gptkbp:partnership
|
gptkb:University
gptkb:Company
gptkb:Purdue_University
gptkb:Stanford_University
gptkb:University_of_California
gptkb:University_of_Michigan
gptkb:University_of_Washington
gptkb:University_of_Texas
gptkb:Northwestern_University
gptkb:Georgia_Tech
gptkb:MIT
|
|
gptkbp:products
|
Metrology equipment
|
|
gptkbp:revenue
|
$100 million (2020)
|
|
gptkbp:services
|
Process control
|
|
gptkbp:specialization
|
Wafer inspection
Surface metrology
Thin film measurement
|
|
gptkbp:subsidiary
|
gptkb:Nanometrics_Canada
|
|
gptkbp:symbol
|
NANO
|
|
gptkbp:target_market
|
Semiconductor manufacturers
MEMS manufacturers
Optoelectronics manufacturers
|
|
gptkbp:technology
|
gptkb:musician
Optical metrology
Laser interferometry
X-ray metrology
|
|
gptkbp:website
|
www.nanometrics.com
|
|
gptkbp:bfsParent
|
gptkb:Company
|
|
gptkbp:bfsLayer
|
3
|