Statements (12)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:KLA-Tencor
|
| gptkbp:acquisitionYear |
2012
|
| gptkbp:foundedIn |
2000
|
| gptkbp:headquartersLocation |
gptkb:Atlanta,_Georgia,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
Qcept Technologies
|
| gptkbp:industry |
gptkb:microprocessor
|
| gptkbp:product |
ChemetriQ inspection system
|
| gptkbp:specializesIn |
semiconductor metrology
non-contact wafer inspection |
| gptkbp:bfsParent |
gptkb:David_K._Lam
|
| gptkbp:bfsLayer |
7
|