Statements (12)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:KLA-Tencor
|
| gptkbp:acquisitionYear |
2007
|
| gptkbp:foundedYear |
2000
|
| gptkbp:founder |
gptkb:Dr._Timothy_J._R._Judd
|
| gptkbp:headquartersLocation |
gptkb:San_Jose,_California,_United_States
|
| gptkbp:industry |
gptkb:microprocessor
|
| gptkbp:product |
process control solutions
wafer metrology sensors |
| gptkbp:bfsParent |
gptkb:KLA_Corporation
|
| gptkbp:bfsLayer |
6
|
| http://www.w3.org/2000/01/rdf-schema#label |
OnWafer Technologies
|