Statements (15)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:Company
|
| gptkbp:acquisition |
gptkb:Tencor_Instruments
|
| gptkbp:founded |
gptkb:1975
|
| gptkbp:founder |
gptkb:Ken_Levy
|
| gptkbp:headquarters |
gptkb:Milpitas,_California
|
| https://www.w3.org/2000/01/rdf-schema#label |
KLA-Tencor Pacific Islands
|
| gptkbp:industry |
Semiconductor Equipment
|
| gptkbp:parent_company |
gptkb:Corporation
|
| gptkbp:products |
Inspection Systems
Metrology Systems |
| gptkbp:services |
gptkb:Software_Solutions
gptkb:customer_support |
| gptkbp:website |
www.kla.com
|
| gptkbp:bfsParent |
gptkb:KLA-Tencor_International
|
| gptkbp:bfsLayer |
6
|