Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
integrated circuits
|
| gptkbp:category |
semiconductor standard
|
| gptkbp:focusesOn |
gptkb:EOS
ESD sensitivity testing |
| gptkbp:fullName |
JESD244: Electrical Overstress (EOS) Electrostatic Discharge (ESD) Sensitivity Testing for Integrated Circuits
|
| https://www.w3.org/2000/01/rdf-schema#label |
JESD244
|
| gptkbp:language |
English
|
| gptkbp:publishedBy |
gptkb:JEDEC
|
| gptkbp:relatedTo |
gptkb:JESD22
|
| gptkbp:usedBy |
semiconductor industry
|
| gptkbp:bfsParent |
gptkb:JEDEC
|
| gptkbp:bfsLayer |
5
|