Statements (18)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:appliesTo |
electronic components
|
| gptkbp:domain |
semiconductor reliability
|
| https://www.w3.org/2000/01/rdf-schema#label |
JESD22
|
| gptkbp:includes |
JESD22-A101
JESD22-A104 JESD22-A108 JESD22-A110 JESD22-B102 |
| gptkbp:publishedBy |
gptkb:JEDEC
|
| gptkbp:purpose |
define test methods for reliability
|
| gptkbp:relatedTo |
MIL-STD-883
|
| gptkbp:usedBy |
semiconductor manufacturers
|
| gptkbp:usedFor |
environmental testing
stress testing qualification testing |
| gptkbp:bfsParent |
gptkb:JEDEC
|
| gptkbp:bfsLayer |
5
|