Statements (17)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:standard
|
| gptkbp:alsoKnownAs |
JESD65
|
| gptkbp:appliesTo |
semiconductor devices
integrated circuits |
| gptkbp:category |
electronics standard
|
| gptkbp:defines |
test conditions for CMOS logic devices
|
| gptkbp:firstPublished |
1993
|
| gptkbp:fullName |
JEDEC Standard No. 65
|
| https://www.w3.org/2000/01/rdf-schema#label |
JEDEC JESD65
|
| gptkbp:publishedBy |
gptkb:JEDEC
|
| gptkbp:status |
active
|
| gptkbp:subject |
gptkb:CMOS_logic
electrical characteristics test methods |
| gptkbp:url |
https://www.jedec.org/standards-documents/docs/jesd65
|
| gptkbp:bfsParent |
gptkb:Phase-Locked_Loop
|
| gptkbp:bfsLayer |
7
|