Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:KLA-Tencor
|
| gptkbp:acquisitionYear |
2008
|
| gptkbp:country |
gptkb:Belgium
|
| gptkbp:focus |
packaging inspection
wafer inspection |
| gptkbp:foundedYear |
1982
|
| gptkbp:founder |
gptkb:Willy_Pellens
|
| gptkbp:headquartersLocation |
gptkb:Leuven,_Belgium
|
| gptkbp:industry |
semiconductor equipment
|
| gptkbp:parentCompany |
gptkb:KLA_Corporation
|
| gptkbp:product |
gptkb:inspection_equipment
metrology systems |
| gptkbp:stockExchange |
gptkb:NASDAQ
|
| gptkbp:stockSymbol |
gptkb:ICOS
|
| gptkbp:bfsParent |
gptkb:KLA
gptkb:KLA_Corporation |
| gptkbp:bfsLayer |
6
|
| https://www.w3.org/2000/01/rdf-schema#label |
ICOS Vision Systems
|