Compact Joint Test Action Group
GPTKB entity
Statements (14)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:electronic_test_interface
|
| gptkbp:abbreviation |
gptkb:cJTAG
|
| gptkbp:application |
microcontrollers
system-on-chip devices |
| gptkbp:feature |
serial communication
backward compatibility with JTAG reduced pin count |
| gptkbp:relatedTo |
gptkb:Joint_Test_Action_Group
|
| gptkbp:standardizedBy |
gptkb:IEEE_1149.7
|
| gptkbp:usedFor |
boundary scan
debugging embedded systems |
| gptkbp:bfsParent |
gptkb:cJTAG
|
| gptkbp:bfsLayer |
6
|
| https://www.w3.org/2000/01/rdf-schema#label |
Compact Joint Test Action Group
|