Statements (20)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
empirical formula
|
| gptkbp:appliesTo |
metal interconnects
|
| gptkbp:describes |
electromigration failure
|
| gptkbp:field |
microelectronics
|
| gptkbp:form |
MTTF = A * J^(-n) * exp(Ea/kT)
|
| https://www.w3.org/2000/01/rdf-schema#label |
Black's equation
|
| gptkbp:parameter |
A (constant)
J (current density) k (Boltzmann constant) Ea (activation energy) T (temperature in Kelvin) n (scaling factor) |
| gptkbp:proposedBy |
gptkb:James_R._Black
|
| gptkbp:publishedIn |
1969
|
| gptkbp:relatedTo |
gptkb:temperature
current density mean time to failure |
| gptkbp:usedIn |
semiconductor reliability
|
| gptkbp:bfsParent |
gptkb:electromigration
|
| gptkbp:bfsLayer |
6
|