Statements (17)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:company
|
| gptkbp:acquiredBy |
gptkb:KLA-Tencor
|
| gptkbp:acquisitionYear |
2006
|
| gptkbp:foundedYear |
1967
|
| gptkbp:founder |
gptkb:Dr._George_Rozsa
|
| gptkbp:headquartersLocation |
gptkb:Westwood,_Massachusetts,_United_States
|
| https://www.w3.org/2000/01/rdf-schema#label |
ADE Corporation
|
| gptkbp:industry |
metrology
semiconductor equipment |
| gptkbp:keyPerson |
gptkb:Dr._George_Rozsa
|
| gptkbp:products |
surface measurement equipment
wafer metrology systems |
| gptkbp:status |
defunct
|
| gptkbp:stockSymbol |
gptkb:ADEX
|
| gptkbp:bfsParent |
gptkb:KLA
gptkb:KLA_Corporation |
| gptkbp:bfsLayer |
6
|