transmission electron microscopy (TEM)
GPTKB entity
Properties (50)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
electron microscopy
|
| gptkbp:analyzes |
crystal structures
defects in materials |
| gptkbp:appliesTo |
materials science
biological samples |
| gptkbp:canBe |
elemental composition
|
| gptkbp:developedBy |
Ernst Ruska
|
| gptkbp:firstHeld |
1931
|
| https://www.w3.org/2000/01/rdf-schema#label |
transmission electron microscopy (TEM)
|
| gptkbp:isPartOf |
analytical techniques
characterization methods material science techniques |
| gptkbp:isRelatedTo |
scanning tunneling microscopy
X-ray diffraction atomic force microscopy |
| gptkbp:isUsedBy |
gptkb:quantum_dots
composite materials interfaces metals ceramics semiconductors thin films biomaterials polymers nanoparticles graphene nanostructures |
| gptkbp:isUsedFor |
metallurgy
nanotechnology semiconductor research materials characterization pharmaceutical research |
| gptkbp:isUsedIn |
academic research
industrial applications |
| gptkbp:isVisitedBy |
sample thickness
electron scattering electron dose vacuum quality |
| gptkbp:mayHave |
morphology
internal structures |
| gptkbp:operatesIn |
vacuum environment
|
| gptkbp:produces |
2D images
|
| gptkbp:provides |
atomic resolution
high magnification |
| gptkbp:relatedTo |
scanning electron microscopy (SEM)
|
| gptkbp:requires |
sample preparation
ultra-thin samples |
| gptkbp:usedFor |
high-resolution imaging
|
| gptkbp:uses |
electron beams
|
| gptkbp:utilizes |
phase contrast
|