selected area electron diffraction
GPTKB entity
Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
electron diffraction technique
|
| gptkbp:abbreviation |
SAED
|
| gptkbp:analyzes |
crystalline materials
|
| gptkbp:category |
electron microscopy
materials characterization |
| gptkbp:developedBy |
TEM sample analysis
|
| https://www.w3.org/2000/01/rdf-schema#label |
selected area electron diffraction
|
| gptkbp:produces |
diffraction pattern
|
| gptkbp:relatedTo |
electron backscatter diffraction
convergent beam electron diffraction |
| gptkbp:resolution_limit |
micron scale
|
| gptkbp:used_in |
transmission electron microscopy
|
| gptkbp:usedFor |
crystallographic analysis
phase identification lattice parameter measurement |
| gptkbp:uses |
parallel electron beam
selected area aperture |
| gptkbp:bfsParent |
gptkb:TEM
|
| gptkbp:bfsLayer |
6
|