Statements (51)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
electronic test equipment
|
| gptkbp:canBe |
automated
handheld benchtop |
| https://www.w3.org/2000/01/rdf-schema#label |
impedance analyzers
|
| gptkbp:manufacturer |
gptkb:Keysight_Technologies
gptkb:Hioki gptkb:Chroma_ATE Wayne Kerr Electronics |
| gptkbp:measures |
resistance
inductance conductance quality factor (Q) capacitance admittance impedance phase angle dissipation factor (D) susceptance |
| gptkbp:operatesIn |
various frequencies
|
| gptkbp:relatedTo |
network analyzers
LCR meters vector impedance meters |
| gptkbp:usedFor |
measuring magnetic properties
measuring transformers analyzing materials characterizing electronic components measuring MEMS devices measuring batteries measuring biological samples measuring cables measuring capacitors measuring connectors measuring dielectric properties measuring electrical impedance measuring electrolytic solutions measuring fuel cells measuring inductors measuring medical devices measuring piezoelectric devices measuring polymer materials measuring printed circuit boards measuring semiconductors measuring sensors measuring solar cells measuring supercapacitors |
| gptkbp:usedIn |
laboratories
manufacturing quality control |
| gptkbp:bfsParent |
gptkb:Zurich_Instruments
|
| gptkbp:bfsLayer |
7
|