high-angle annular dark-field imaging
GPTKB entity
Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
microscopy technique
|
| gptkbp:abbreviation |
HAADF
|
| gptkbp:detects |
scattered electrons
|
| gptkbp:developedBy |
1980s
|
| https://www.w3.org/2000/01/rdf-schema#label |
high-angle annular dark-field imaging
|
| gptkbp:provides |
atomic number contrast
|
| gptkbp:relatedTo |
Z-contrast imaging
|
| gptkbp:requires |
annular detector
|
| gptkbp:usedFor |
material characterization
nanostructure analysis |
| gptkbp:usedIn |
scanning transmission electron microscopy
|
| gptkbp:bfsParent |
gptkb:TEM
|
| gptkbp:bfsLayer |
6
|