built-in self-test (BIST) technology
GPTKB entity
Statements (19)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
gptkb:technology
|
| gptkbp:appliesTo |
digital circuits
microprocessors memory chips |
| gptkbp:component |
control logic
output response analyzer test pattern generator |
| gptkbp:enables |
automatic fault detection
|
| https://www.w3.org/2000/01/rdf-schema#label |
built-in self-test (BIST) technology
|
| gptkbp:purpose |
self-testing
|
| gptkbp:reduces |
need for external test equipment
|
| gptkbp:relatedTo |
design for testability
automatic test pattern generation (ATPG) fault coverage scan design |
| gptkbp:usedIn |
integrated circuits
electronic systems |
| gptkbp:bfsParent |
gptkb:LogicVision
|
| gptkbp:bfsLayer |
7
|