Statements (49)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
analytical technique
|
| gptkbp:alternativeTo |
transmission electron microscopy
energy-dispersive X-ray spectroscopy secondary ion mass spectrometry scanning transmission electron microscopy atom probe field ion microscopy |
| gptkbp:commercialized_by |
CAMECA
LEAP (Local Electrode Atom Probe) |
| gptkbp:data_analysis_software |
gptkb:IVAS
AP Suite |
| gptkbp:detects |
ions
individual atoms |
| gptkbp:developedBy |
1960s
|
| gptkbp:enables |
chemical composition analysis
spatial distribution analysis |
| https://www.w3.org/2000/01/rdf-schema#label |
atom probe tomography
|
| gptkbp:inventedBy |
Erwin Müller
|
| gptkbp:limitation |
limited field of view
field evaporation artifacts preferential evaporation reconstruction challenges sample preparation complexity |
| gptkbp:output |
3D atom maps
|
| gptkbp:relatedTo |
time-of-flight mass spectrometry
field ion microscopy |
| gptkbp:requires |
ultra-high vacuum
high electric field cryogenic temperatures (sometimes) |
| gptkbp:resolution |
sub-nanometer
|
| gptkbp:type |
needle-shaped specimen
|
| gptkbp:used_in |
gptkb:nanotechnology
materials science metallurgy |
| gptkbp:usedFor |
thin film analysis
corrosion studies failure analysis semiconductor analysis isotopic analysis 3D atomic-scale characterization alloy analysis grain boundary analysis interface analysis precipitate analysis |
| gptkbp:uses |
time-of-flight measurement
laser pulsing position-sensitive detector voltage pulsing |
| gptkbp:bfsParent |
gptkb:Physical_Metallurgy
|
| gptkbp:bfsLayer |
8
|