Statements (52)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
analytical technique
|
| gptkbp:analyzes |
crystalline materials
|
| gptkbp:application |
gptkb:nanotechnology
chemistry geology materials science metallurgy mineralogy pharmaceuticals physics forensics |
| gptkbp:basedOn |
gptkb:Bragg's_law
|
| gptkbp:cannotAnalyze |
amorphous materials
|
| gptkbp:commonInstrument |
powder diffractometer
single crystal diffractometer |
| gptkbp:detects |
gptkb:center
texture crystallite size atomic arrangement crystal orientation defects in crystals grain size phase composition unit cell dimensions |
| gptkbp:discoveredBy |
gptkb:Max_von_Laue
|
| gptkbp:discoveredIn |
1912
|
| gptkbp:fullName |
X-ray diffraction
|
| https://www.w3.org/2000/01/rdf-schema#label |
XRD
|
| gptkbp:output |
diffraction pattern
intensity vs. angle plot |
| gptkbp:relatedTo |
X-ray crystallography
electron diffraction neutron diffraction |
| gptkbp:requires |
gptkb:software
detector monochromatic X-ray source sample holder sample preparation |
| gptkbp:usedFor |
crystallography
determining crystal structure material characterization analyzing bulk materials analyzing powders analyzing thin films measuring lattice parameters phase identification |
| gptkbp:uses |
gptkb:X-rays
gptkb:Cu_Kα_radiation gptkb:Mo_Kα_radiation synchrotron radiation |
| gptkbp:bfsParent |
gptkb:XRDS
|
| gptkbp:bfsLayer |
6
|