Statements (13)
| Predicate | Object |
|---|---|
| gptkbp:instance_of |
gptkb:product
|
| gptkbp:developed_by |
gptkb:Corporation
|
| https://www.w3.org/2000/01/rdf-schema#label |
Wafer Sense
|
| gptkbp:includes |
gptkb:sensors
|
| gptkbp:is_designed_for |
process control
|
| gptkbp:is_part_of |
metrology solutions
|
| gptkbp:measures |
wafer characteristics
|
| gptkbp:provides |
real-time data
|
| gptkbp:supports |
yield improvement
|
| gptkbp:used_in |
gptkb:Company
|
| gptkbp:utilizes |
gptkb:advanced_technology
|
| gptkbp:bfsParent |
gptkb:Cyber_Optics_Asia
|
| gptkbp:bfsLayer |
6
|