Statements (21)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
product line
|
| gptkbp:application |
process monitoring
equipment diagnostics tool qualification |
| gptkbp:dataRate |
real-time
|
| gptkbp:firstReleased |
2005
|
| gptkbp:formFactor |
wafer-shaped
|
| gptkbp:function |
wireless measurement device
|
| https://www.w3.org/2000/01/rdf-schema#label |
WaferSense
|
| gptkbp:industry |
gptkb:microprocessor
|
| gptkbp:manufacturer |
gptkb:CyberOptics_Corporation
|
| gptkbp:measures |
gptkb:temperature
humidity vibration leveling airborne particles |
| gptkbp:usedIn |
semiconductor manufacturing
|
| gptkbp:website |
https://www.cyberoptics.com/products/semiconductor/wafer-sense/
|
| gptkbp:wireless |
true
|
| gptkbp:bfsParent |
gptkb:CyberOptics
|
| gptkbp:bfsLayer |
7
|