Statements (11)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
semiconductor test system
|
| gptkbp:application |
final test
wafer testing |
| gptkbp:category |
automatic test equipment
|
| https://www.w3.org/2000/01/rdf-schema#label |
VF5xx
|
| gptkbp:manufacturer |
gptkb:Advantest
|
| gptkbp:market |
semiconductor industry
|
| gptkbp:supports |
various device interfaces
|
| gptkbp:usedFor |
testing semiconductor devices
|
| gptkbp:bfsParent |
gptkb:Vybrid_series
|
| gptkbp:bfsLayer |
7
|