US 74,000,003 B2

GPTKB entity

Properties (48)
Predicate Object
gptkbp:instanceOf patent
gptkbp:covers semiconductor technology
gptkbp:hasAbstract A method for enhancing the performance of a semiconductor device.
gptkbp:hasApplicationNumber 11/123,456
gptkbp:hasAssignee gptkb:XYZ_Corporation
gptkbp:hasCitations gptkb:US_73,000,003_B2
gptkb:US_73,000,002_B2
gptkb:US_73,000,001_B2
gptkbp:hasClaim 20
gptkbp:hasCountry gptkb:United_States
gptkbp:hasDescription This patent describes a method to improve semiconductor device performance.
gptkbp:hasFeature required
gptkbp:hasFieldOfUse electronics
gptkbp:hasFilingDate 2006-05-15
gptkbp:hasInternationalClassification H01L
gptkbp:hasInventor gptkb:John_Doe
Jane_Smith
gptkbp:hasLegalStatus active
gptkbp:hasPatentNumber 74000003
gptkbp:hasPriorityDate 2005-05-15
2028-05-15
gptkbp:hasPublications 2008-05-06
gptkbp:hasRelatedPatent gptkb:US_74,000,007_B2
gptkb:US_74,000,006_B2
US_74,000,005_B2
gptkbp:hasTechnicalField semiconductor fabrication
gptkbp:hasTechnology semiconductor device performance enhancement.
gptkbp:hasTitle Method for enhancing the performance of a semiconductor device
https://www.w3.org/2000/01/rdf-schema#label US 74,000,003 B2
gptkbp:isCitedBy gptkb:US_75,000,002_B2
gptkb:US_75,000,001_B2
gptkb:US_75,000,003_B2
gptkbp:isExaminedBy gptkb:USPTO_examiner
gptkb:United_States
gptkbp:isFiledIn gptkb:USPTO
gptkb:United_States
gptkbp:isFiledUnder utility patent
non-provisional patent
gptkbp:isGranted true
gptkbp:isPartOf patent portfolio
patent family
gptkbp:isPublishedIn gptkb:USPTO
patent database
gptkbp:isRelatedTo gptkb:US_74,000,002_B2
gptkb:US_74,000,004_B2
gptkb:US_74,000,001_B2
gptkbp:isSubjectTo patent law
patent examination process