gptkbp:instanceOf
|
patent
|
gptkbp:covers
|
semiconductor technology
|
gptkbp:hasAbstract
|
A method for enhancing the performance of semiconductor devices.
|
gptkbp:hasApplicationNumber
|
14/123456
|
gptkbp:hasAssignee
|
gptkb:Tech_Innovations_LLC
|
gptkbp:hasCitations
|
10
|
gptkbp:hasClaim
|
2
1
10
20
3
4
5
6
7
8
9
|
gptkbp:hasCountry
|
gptkb:United_States
|
gptkbp:hasFeature
|
paid
|
gptkbp:hasFieldOfUse
|
electronics
semiconductor devices
electronics engineering
|
gptkbp:hasFilingDate
|
2014-05-01
|
gptkbp:hasInternationalClassification
|
H01L
|
gptkbp:hasInventor
|
gptkb:John_Doe
|
gptkbp:hasLegalStatus
|
gptkb:Tech_Innovations_LLC
active
regular
|
gptkbp:hasPatentNumber
|
45678902
|
gptkbp:hasPriorityDate
|
2015-01-01
2013-05-01
|
gptkbp:hasPublications
|
2015-01-01
|
gptkbp:hasRelatedPatent
|
gptkb:US_45678901_B2
|
gptkbp:hasTechnicalField
|
semiconductor fabrication
|
gptkbp:hasTechnology
|
improved efficiency
|
gptkbp:hasTitle
|
Method for enhancing the performance of a semiconductor device
|
https://www.w3.org/2000/01/rdf-schema#label
|
US 45678902 B2
|
gptkbp:isAssignedTo
|
gptkb:Tech_Innovations_LLC
|
gptkbp:isCitedBy
|
gptkb:US_78901234_B2
|
gptkbp:isCitedIn
|
gptkb:US_45678903_B2
|
gptkbp:isExaminedBy
|
gptkb:USPTO
true
|
gptkbp:isFiledIn
|
gptkb:United_States
|
gptkbp:isFiledUnder
|
gptkb:John_Doe
US_patent_law
|
gptkbp:isGranted
|
true
|
gptkbp:isPartOf
|
patent family
US_patent_system
|
gptkbp:isPublishedIn
|
gptkb:USPTO
USPTO database
|
gptkbp:isRelatedTo
|
gptkb:US_12345678_B1
|
gptkbp:isSubjectTo
|
patent law
|
gptkbp:usesTechnology
|
microelectronics
|