Properties (66)
| Predicate | Object |
|---|---|
| gptkbp:instanceOf |
patent
|
| gptkbp:covers |
semiconductor technology
|
| gptkbp:hasAbstract |
This patent describes a method for improving semiconductor device performance.
|
| gptkbp:hasAssignee |
gptkb:Tech_Innovations_LLC
|
| gptkbp:hasClaim |
20
A method for enhancing manufacturing efficiency. A method for enhancing performance. A method for enhancing reliability. A method for improving device performance. A method for optimizing performance. A method for reducing power consumption. A method for enhancing semiconductor performance. A method for improving semiconductor yield. A method for increasing efficiency. A method for optimizing semiconductor processes. A fabrication process. A semiconductor device. A method for reducing defects. A method for enhancing device efficiency. A method for enhancing device fabrication. A method for enhancing device longevity. A method for enhancing device reliability. A method for enhancing electrical characteristics. A method for enhancing electrical performance. A method for enhancing fabrication techniques. A method for enhancing process control. A method for enhancing thermal management. A method for improving device longevity. A method for improving electrical characteristics. A method for improving manufacturing processes. A method for improving material properties. A method for improving signal integrity. A method for improving thermal performance. A method for improving yield. A method for optimizing device characteristics. A method for optimizing semiconductor design. An application in electronics. |
| gptkbp:hasCountry |
16/123456
|
| gptkbp:hasDescription |
A method to enhance the efficiency of semiconductor devices.
|
| gptkbp:hasFeature |
paid
|
| gptkbp:hasFieldOfUse |
electronics
|
| gptkbp:hasFilingDate |
2019-05-15
2021-01-05 |
| gptkbp:hasInternationalClassification |
H01L
|
| gptkbp:hasInventor |
gptkb:John_Doe
Jane_Smith |
| gptkbp:hasLegalStatus |
active
examined |
| gptkbp:hasPatentNumber |
3030303029
|
| gptkbp:hasPriorityDate |
2018-05-15
|
| gptkbp:hasPublications |
B2
2021-01-05 |
| gptkbp:hasTechnicalField |
semiconductor fabrication
|
| gptkbp:hasTitle |
Method for enhancing the performance of a semiconductor device
|
| https://www.w3.org/2000/01/rdf-schema#label |
US 3030303029 B2
|
| gptkbp:isAssignedTo |
gptkb:Tech_Innovations_LLC
|
| gptkbp:isCitedBy |
gptkb:US_3030303031_B2
gptkb:US_3030303030_B2 |
| gptkbp:isExaminedBy |
true
|
| gptkbp:isFiledIn |
gptkb:United_States
|
| gptkbp:isFiledUnder |
utility patent
|
| gptkbp:isGranted |
true
|
| gptkbp:isPartOf |
US_patent_family
|
| gptkbp:isPublishedIn |
gptkb:USPTO
|
| gptkbp:isRelatedTo |
US_3030303027_B2
US_3030303028_B2 |