|
gptkbp:instanceOf
|
patent
|
|
gptkbp:hasAbstract
|
This invention relates to a method for enhancing the performance of semiconductor devices.
|
|
gptkbp:hasApplicationNumber
|
12/890,121
|
|
gptkbp:hasAssignee
|
gptkb:Tech_Innovations_LLC
|
|
gptkbp:hasCitations
|
5
|
|
gptkbp:hasClaim
|
20
4.
3.
20.
5.
13.
15.
19.
2.
6.
16.
1.
11.
12.
14.
7.
8.
10.
9.
17.
18.
|
|
gptkbp:hasCountry
|
gptkb:US
|
|
gptkbp:hasDescription
|
A detailed description of the method and its applications.
|
|
gptkbp:hasFeature
|
paid
|
|
gptkbp:hasFieldOfUse
|
electronics
electronics manufacturing
|
|
gptkbp:hasFilingDate
|
2012-06-21
2011-12-15
|
|
gptkbp:hasInternationalClassification
|
H01L
|
|
gptkbp:hasInventor
|
gptkb:John_Doe
Jane_Smith
|
|
gptkbp:hasLegalEvent
|
patent granted
|
|
gptkbp:hasLegalStatus
|
active
full examination
|
|
gptkbp:hasPriorityDate
|
2010-12-15
|
|
gptkbp:hasPublications
|
S1
2012-06-21
|
|
gptkbp:hasTechnicalField
|
semiconductor devices
|
|
gptkbp:hasTechnology
|
improved performance
|
|
gptkbp:hasTitle
|
Method for enhancing the performance of a semiconductor device
|
|
https://www.w3.org/2000/01/rdf-schema#label
|
US 27,890,121 S1
|
|
gptkbp:isAssignedTo
|
gptkb:Tech_Innovations_LLC
|
|
gptkbp:isCitedBy
|
US_28,000,000_B2
|
|
gptkbp:isExaminedBy
|
gptkb:USPTO
|
|
gptkbp:isFiledIn
|
gptkb:United_States
|
|
gptkbp:isFiledUnder
|
gptkb:John_Doe
Class 257
|
|
gptkbp:isGranted
|
true
|
|
gptkbp:isInFamilyWith
|
gptkb:US_27,890,120_S1
|
|
gptkbp:isPartOf
|
patent family
|
|
gptkbp:isPublishedIn
|
gptkb:US_2012/0156789_A1
USPTO database
|
|
gptkbp:isRelatedTo
|
gptkb:US_27,890,120_S1
gptkb:US_27,890,122_S1
|
|
gptkbp:usesTechnology
|
semiconductor technology
|